XEDS with SDD-technology in scanning transmission electron microscopy

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 202-203

  Falke, M ^a   Mogilatenko, A ^b   Kirmse, H ^b   Neumann, W ^b   Brombacher, C ^c   Albrecht, M ^c   Bleloch, A ^d   Trankle G ^e   Kappel A ^a   Terborg, R ^a   Kroemer, R ^a   Rohde, M ^a  

^a BRUKER AXS GMBH   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

^c CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^d UNIVERSITY OF LIVERPOOL   (United Kingdom)

^e LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

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EID: 69949170565     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609095270     Document Type: Article

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