Challenges in achieving high resolution at low voltages in the SEM

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 660-661

  Michael, J R ^a   Joy, D C ^b   Griffin, B J ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949169329     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094185     Document Type: Article

References (4)

1. D, C, Joy, in: Biological Low-Voltage Scanning Electron Microscopy, (eds H,. Schatten and J.\ Pawley), Springer, 2008, p 107-127.
2. D. C. Joy et al., Microsc. Microanal, 13(suppl 2) (2007) 1682CD.
3. IMAGEJ written by Wayne Rasband is available from (http://rsb.ifo.nih. gov/ij/), SMARTJ plug-in is available from D. C. Joy (djoy@utk.edu).
4. Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy (DOE) under contract DEAC0494AL85000.