Atmospheric electron microscope: Limits of observable depth

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 924-925

  Suga, M ^a   Nishiyama, H ^a   Ebihara, T ^b   Ogura, T ^b   Sato, C ^b  

^a JEOL LTD   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949168493     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609095774     Document Type: Article

References (2)

1. H. Nishiyama, M. Suga, M. Koizumi, S. Kitamura, M. Tsuyuki, Y. Ishimori, T. Sato, T. Ogura, C. Sato, New Scanning Electron Microscope Capable of Observing Cells in Solution, to be published in this volume.
2. P. Hovington, D. Drouin, R. Gauvin, CASINO: a new Monte Carlo code in C Language for electron beam interaction " Part I: description of the program, Scanning 19 (1997) 1-14.