Contamination removal rates improved by new impedance matching network, for the evactron® De-contaminator

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 812-813

  Morgan, Christopher G ^a   Bernheim, Ross ^a   Vane, Ronald ^a  

^a XEI Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949154610     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093064     Document Type: Article

References (2)

1. http://evactron.com/technical.html
2. Morgan, Christopher G., Gleason, Mark M. and Ron Vane, Microscopy Today 15 (5) (2007) 22.