Solving the "micro-to-macro" spatial scale problem with milliprobe X-ray fluorescence/X-ray spectrum imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7378, Issue , 2009, Pages

  Newbury, Dale E ^a   Davis, Jeff M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Elemental mapping; Energy dispersive x ray spectrometry; Microanalysis; Scanning electron microscopy; Spatially resolved analysis; Trace analysis; X ray fluorescence analysis; X ray microanalysis

Indexed keywords

ELEMENTAL MAPPING; ENERGY DISPERSIVE X-RAY SPECTROMETRY; SPATIALLY-RESOLVED ANALYSIS; X-RAY FLUORESCENCE ANALYSIS; X-RAY MICROANALYSIS;

AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; FLUORESCENCE; GAS TURBINES; MAPPING; MEASUREMENT THEORY; MICROANALYSIS; SCANNING; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; SPECTRUM ANALYSIS; TRACE ANALYSIS; X RAYS;

X RAY ANALYSIS;

EID: 69949122006     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.824629     Document Type: Conference Paper

References (7)

1. Goldstein, J., Newbury, D., Joy, D., Lyman, C., Echlin, P., Lifshin, E., Sawyer, L., and Michael, J., [Scanning Electron Microscopy and X-ray Microanalysis] 3rd edition, Springer, New York, 1-20 (2003).
2. Carpenter, D.A., and Taylor, M.A., "Fast, High Resolution X-ray Microfluorescence Imaging." Advances in X-ray Analysis, 34, 217 (1991).
3. Bright, D., "NIST Lispix, a comprehensive image processing software platform", NIST Microanalysis Software Resource, available free at http://www.nist.gov/lispix/(2009).
4. Bright, D. and Newbury, D., "Maximum Pixel Spectrum: A New Tool For Detecting And Recovering Rare, Unanticipated Features From Spectrum Image Data Cubes," J. Microscopy 216, 186-193 (2004). (Pubitemid 39469792)
5. Davis, J., Newbury, D., Rangaraju, P., Soundrapanian, S., Giebson, C., "Milli X-ray fluorescence X-ray spectrum imaging for measuring potassium ion intrusion into concrete samples." Cement and Concrete Composites, 31, 171-175 (2009).
6. Newbury, D., "X-ray Spectrometry and Spectrum Image Mapping at Output Count Rates above 100 kHz with a Silicon Drift Detector on a Scanning Electron Microscope," SCANNING, 27, 227-239 (2005).
7. Davilla, S., "Event Streamed Spectrum Imaging (ESSI)," Microsc Microanal 13 (2), 1344-1345, (2007).