Image quality improvements in thermionic scanning electron microscopes

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 236-237

  Phifer, D W ^a   Wandrol, P ^a   Vystavel, T ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949119305     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609097049     Document Type: Article

References (2)

1. I. Mullerova and L. Frank, Advances in Imaging and Electron Physics, 2003. 128: 309-443.
2. E. Bauer, Rep. Prog. Phys., 1994. 57: 895-938.