Quantitative analysis of alloy structure by aberration corrected STEM

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 426-427

  Weyland, M ^a   Muddle, B C ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949118464     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609097347     Document Type: Article

References (3)

1. J.F. Nie and B.C. Muddle, Mat. Sci. and Eng. A319-321 (2001) 448
2. Kovarik et al, Acta. Mat. 56 (2008) 4804
3. Time on the Tecnai F20 at the Cornell University CCMR kindly provided by Prof. David Muller and support provided Mr John Grazul