Electron microscopy analysis of interfaces in oxides for energy applications

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 1444-1445

  Winterstein, Jonathan P ^a   Wang, Chenchen ^a   Carter, C Barry ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949116300     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760909357X     Document Type: Article

References (10)

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4. A. Tschope, J Electroceram 14 (2005) 5.
5. T. S. Zhang, J. Ma, L. B. Kong and S. H. Chan, J Mater Sci 39 (2004) 6371.
6. R. Gerhardt, A. S. Nowick, M. E. Mochel and I. Dumler, J Am Ceram Soc 69 (1986) 647.
7. R. Gerhardt and A. S. Nowick, J Am Ceram Soc 69 (1986) 641.
8. A. Hauch, J. R. Bowen, L. T. Kuhn and M. Mogensen, Electrochem Solid State Lett 11 (2008) B38.
9. A. Hauch, S. H. Jensen, J. B. Bilde-Sorensen and M. Mogensen, J Electrochem Soc 154 (2007) A619.
10. JPW acknowledges support from the Air Force through an NDSEG Fellowship.