Semi-empirical Scattering model for chemical vapor deposited zinc sulfide

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7302, Issue , 2009, Pages

  McCloy, John ^a,b  

^a RAYTHEON COMPANY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Chemical vapor deposition; IR window; Optical scattering; Surface scattering; Zinc sulfide

Indexed keywords

ALTERNATING LAYERS; BAND EDGE; BULK SAMPLES; CHEMICAL VAPOR DEPOSITED; INTERNAL SURFACES; IR WINDOW; LAYER THICKNESS; MULTI-SPECTRAL; OPTICAL SCATTERING; SCATTERING MODEL; SEMI-EMPIRICAL; SURFACE SCATTERING; TRANSMISSION MEASUREMENTS; WURTZITES; ZN(O ,S);

CHEMICAL VAPOR DEPOSITION; DOMES; LIGHT REFRACTION; LIGHT SCATTERING; OXYGEN; PLASMA INTERACTIONS; REFRACTIVE INDEX; REFRACTOMETERS; SCATTERING; SULFIDE MINERALS; SURFACES; VAPORS; WINDOWS; ZINC;

ZINC SULFIDE;

EID: 69949112024     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.819536     Document Type: Conference Paper

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