Overhead image statistics

Proceedings - Applied Imagery Pattern Recognition Workshop

Volumn , Issue , 2008, Pages

  Vijayaraj, V ^a   Cheriyadat, A M ^a   Sallee, Phil ^b   Colder, Brian ^c   Vatsavai, R R ^a   Bright, E A ^a   Bhaduri, B L ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b BOOZ ALLEN HAMILTON   (United States)

^c Colder Scientific ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CO-OCCURRENCE; CO-OCCURRENCE STATISTICS; COMPUTER VISION ALGORITHMS; CONTOUR SHAPE; GRADIENT DISTRIBUTIONS; HIGH RESOLUTION; IMAGE ANALYSIS ALGORITHMS; IMAGE GRADIENTS; IMAGE MODELS; IMAGE STATISTICS; NATURAL IMAGE STATISTICS; NATURAL IMAGES; STATISTICAL IMAGES; STATISTICAL PROPERTIES; WAVELET COEFFICIENTS;

COMPUTER VISION; DISCRETE COSINE TRANSFORMS; IMAGE ANALYSIS; LAND USE; POWER SPECTRUM; SECURITY OF DATA; STATISTICS;

EDGE DETECTION;

EID: 69949104510     PISSN: 15505219     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AIPR.2008.4906471     Document Type: Conference Paper

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