RBS spectrometric studies on the interdiffusion profile of multilayer thin film structure to yield Cd1-xMnxTe alloy

Journal of Alloys and Compounds

Volumn 484, Issue 1-2, 2009, Pages 712-717

  Banerjee, Pushan ^a   Ghosh, Biswajit ^a  

^a JADAVPUR UNIVERSITY   (India)

Author keywords

Diffusion; Magnetic films and multilayers; Rutherford Back Scattering; Vapour deposition

Indexed keywords

ALLOY FILM; BI-LAYER; CDTE; HALL MEASUREMENTS; INTER-DIFFUSION; MAGNETIC FILMS AND MULTILAYERS; MAGNETO-OPTIC KERR EFFECT; MULTILAYER STRUCTURES; MULTILAYER THIN FILM STRUCTURE; NUMBER OF LAYERS; RUTHERFORD BACK SCATTERING; SPINTRONIC MATERIALS; THERMAL INTERDIFFUSION; TRILAYERS; VAPOUR DEPOSITION;

BACKSCATTERING; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CERIUM ALLOYS; FABRICATION; GRAIN BOUNDARIES; KERR MAGNETOOPTICAL EFFECT; MAGNETIC DEVICES; MAGNETIC FIELD EFFECTS; MAGNETIC FILMS; MAGNETIC MULTILAYERS; MANGANESE; MANGANESE COMPOUNDS; METALLIC FILMS; SINGLE CRYSTALS; SPECTROMETRY; TELLURIUM COMPOUNDS; THIN FILMS;

FILM PREPARATION;

EID: 69949093438     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.05.024     Document Type: Article

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