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Volumn 78, Issue 12, 2009, Pages 1211-1215

EPR study of radiation damage to DNA irradiated with synchrotron soft X-rays around nitrogen and oxygen K-edge

Author keywords

EPR; Nitrogen K edge; Oxygen K edge; Radiation damage to DNA; Synchrotron radiation

Indexed keywords

AUGER ELECTRON; DNA DAMAGES; ELECTRON PARAMAGNETIC RESONANCE; EPR; EPR SPECTRA; EPR STUDIES; FINE STRUCTURES; IN-SITU; NITROGEN K-EDGE; NUCLEOBASES; OXYGEN K-EDGE; PHOTOABSORPTION SPECTRA; PHOTOELECTRIC EFFECT; PHOTON ENERGY; PHYSICO-CHEMICAL MECHANISMS; SAMPLE SURFACE; SHORT-LIVED SPECIES; SOFT X-RAY; SPIN CONCENTRATION; UNPAIRED ELECTRONS; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES;

EID: 69949091129     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2009.07.013     Document Type: Article
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.