Relaxor behavior and dielectric properties of (La, Ta)-modified (K0.5Na0.5)NbO3 lead-free ceramics

Journal of Alloys and Compounds

Volumn 484, Issue 1-2, 2009, Pages 233-238

  Hao, Jigong ^a   Xu, Zhijun ^a   Chu, Ruiqing ^a   Li, Wei ^a   Li, Guorong ^b   Yin, Qingrui ^b  

^a LIAOCHENG UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Dielectric properties; Ferroelectrics; Phase transitions; Piezoelectricity; Relaxor

Indexed keywords

COMPOSITION RANGES; DIELECTRIC STUDIES; ELECTRICAL PROPERTY; ELECTROMECHANICAL COUPLING COEFFICIENTS; ELECTROMECHANICAL TRANSDUCERS; FERROELECTRIC RELAXOR BEHAVIOR; FERROELECTRIC-TO-RELAXOR; FERROELECTRICS; LA DOPING; LEAD FREE CERAMICS; LEAD-FREE MATERIAL; LEAD-FREE RELAXOR; P-E HYSTERESIS LOOPS; PIEZOELECTRIC CONSTANT; RELAXOR; RELAXOR BEHAVIOR; REMNANT POLARIZATIONS; SOLID-STATE ROUTES;

CERAMIC CAPACITORS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRIC PROPERTIES; ELECTROMECHANICAL DEVICES; FERROELECTRICITY; HYSTERESIS; HYSTERESIS LOOPS; LANTHANUM; NIOBIUM; PHASE TRANSITIONS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; PYROELECTRICITY; SODIUM; TANTALUM; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC CERAMICS;

EID: 69949086573     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.03.174     Document Type: Article

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