Effect of substrate strain on lattice structure, electrical resistivity, and optical conductivity of Nd0.5 Sr0.5 MnO3 thin films grown on SrTiO3

Solid State Communications

Volumn 149, Issue 41-42, 2009, Pages 1760-1764

  Jang, S Y ^a   Nakagawa, N ^b   Moon, S J ^a   Susaki, T ^b   Kim, K W ^a   Lee, Y S ^c   Hwang, H Y ^b,d   Myung Whun, K ^e  

^a Seoul National University   (South Korea)

^b UNIVERSITY OF TOKYO   (Japan)

^c Soongsil University   (South Korea)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^e Chonbuk National University   (South Korea)

Author keywords

A. Nd0.5Sr0.5MnO3 thin film; B. PLD; C. Strain; D. Optical conductivity

Indexed keywords

A. ND0.5SR0.5MNO3 THIN FILM; B. PLD; C. STRAIN; CARRIER DYNAMICS; D. OPTICAL CONDUCTIVITY; ELECTRICAL RESISTIVITY; IN-PLANE LATTICES; INSULATOR-METAL PHASE; LATTICE STRUCTURES; SINGLE CRYSTAL DATA; SRTIO; SUBSTRATE LATTICE; SUBSTRATE STRAIN;

CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; GROUND STATE; INSULATION; MANGANESE COMPOUNDS; METAL INSULATOR TRANSITION; NEODYMIUM; OPTICAL CONDUCTIVITY; PROGRAMMABLE LOGIC CONTROLLERS; SINGLE CRYSTALS; STRONTIUM ALLOYS; SUBSTRATES; THIN FILM DEVICES; THIN FILMS; VAPOR DEPOSITION;

TENSILE STRAIN;

EID: 69849103582     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.07.025     Document Type: Article

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