Thickness-independent complex permittivity determination of partially filled thin dielectric materials into rectangular waveguides

Progress in Electromagnetics Research

Volumn 93, Issue , 2009, Pages 189-203

  Hasar, U C ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PERMITTIVITY; PERMITTIVITY MEASUREMENT; WAVEGUIDES;

COMPLEX PERMITTIVITY; COMPLEX PERMITTIVITY DETERMINATION; COMPLEX PERMITTIVITY MEASUREMENT; LATERAL SURFACE; MEASUREMENTS OF; MICROWAVE METHODS; PROPAGATION CONSTANT; SAMPLE THICKNESS;

DIELECTRIC MATERIALS;

EID: 69849087000     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER09042212     Document Type: Article

References (34)

1. Chen, L. F., C. K. Ong, C. P. Neo, et al., Microwave Electronics: Measurement and Materials Characterization, John Wiley & Sons, West Sussex, England, 2004.
2. Nyfors, E., "Industrial microwave sensors - A review," Subsurface Sensing Tech. and Appl., Vol. 1, 23-43, 2000.
3. Hebeish, A. A., M. A. Elgamel, R. A. Abdelhady, et al., "Factors affecting the performance of the radar absorbant textile materials of different types and structures," Progress In Electromagnetics Research B, Vol. 3, 219-226, 2008.
4. Zhang, H., S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Progress In Electromagnetics Research B, Vol. 10, 145-161,2008.
5. Li, E., Z.-P. Nie, G. Guo, Q. Zhang, Z. Li, and F. He, "Broadband measurements of dielectric properties of low-loss materials at high temperatures using circular cavity method," Progress In Electromagnetics Research, PIER 92, 103-120, 2009.
6. Williams, T. C., M. A. Stuchly, and P. Saville, "Modified transmission-reflection method for measuring constitutive parameters of thin flexible high-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 51, 1560-1566, 2003.
7. Hasar, U. C., "Thickness-independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements," Progress In Electromagnetics Research, PIER 92, 17-32, 2009.
8. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, 33-36, 1974.
9. Nicolson, A. M. and G. Ross, "Measurement of the intrinsic properties of materials by time-domain techniques," IEEE Trans. Instrum. Meas., Vol. 19, 377-382, 1970.
10. Hasar, U. C., "An accurate complex permittivity method for thin dielectric materials," Progress In Electromagnetics Research, PIER 91, 123-138, 2009.
11. Hasar, U. C., "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sci. Technol., Vol. 19, 055706-055715, 2008.
12. Hasar, U. C., "A fast and accurate amplitude-only transmission- reflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 56, 2129-2135,2008.
13. Hasar, U. C. and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 57, 471-477, 2009.
14. Catala-Civera, J. M., A. J. Canos, F. L. Penaranda-Foix, and E. de los Reyes Davo, "Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides," IEEE Trans. Microw. Theory Tech., Vol. 51, 16-24, 2003.
15. Chung, B. K., "A convenient method for complex permittivity measurements of thin materials at microwave frequencies," J. Physics D: Appl. Phys., Vol. 39, 1926-1931, 2006.
16. Akhtar, J. M., L. E. Feher, and M. Thumm, "Noninvasive procedure for measuring the complex permittivity of resins, catalysts, and other liquids using a partially filled rectangular waveguide structure," IEEE Trans. Microw. Theory Tech., Vol. 57, 458-470, 2009.
17. Chung, B.-K., "Dielectric constant measurement for thin material at microwave frequencies," Progress In Electromagnetics Research, PIER 75, 239-252, 2007.
18. Murata, K., A. Hanawa, and R. Nozaki, "Broadband complex permittivity measurement techniques of materials with thin configuration at microwave frequencies," J. Applied Phys., Vol. 98, 084107-1-084107-08, 2005.
19. Pitarch, J., M. Contelles-Cervera, F. L. Penaranda-Foix, and J. M. Catala-Civera, "Determination of the permittivity and permeability for waveguides partiallyed loaded with isotropic samples," Meas. Sci. Technol., Vol. 17, 145-152, 2006.
20. Olmi, R., M. Tedesco, C. Riminesi, et al., "Thickness-independent measurement of the permittivity of thin samples in the X band," Meas. Sci. Technol., Vol. 13, 503-509, 2002.
21. Baker-Jarvis, J., M. D. Janezic, P. D. Domich, et al., "Analysis of an open-ended coaxial probe with lift-off for nondestructive testing," IEEE Trans. Instrum. Meas., Vol. 43, 711-718, 1994.
22. Balanis, C. A., Advanced Engineering Electromagnetics, John Wiley & Sons, New Jersey, NJ, 1989.
23. Harrington, R. F., Time-Harmonic Electromagnetic Fields, John Wiley & Sons and IEEE Press, New York, NY, 2001.
24. Collin, R. E., Field Theory of Guided Waves, IEEE Press, New York, NY, 1991.
25. Marcuvitz, N., Waveguide Handbook, McGraw-Hill, New York, NY, 1951.
26. Inan, U. S. and A. S. Inan, Electromagnetic Waves, Prentice Hall, New Jersey, NJ, 2000.
27. Vartanian, P. H., W. P. Ayres, and A. L. Helgesson, "Propagation in dielectric slab loaded rectangular waveguide," IRE Trans. Microw. Theory Tech., Vol. 5, 215-222, 1958.
28. Challa, R. K., D. Kajfez, J. R. Gladden, and A. Z. Elsherbeni, "Permittivity measurement with as non-standard waveguide by using TRL calibration and fractional linear data fitting," Progress In Electromagnetics Research B, Vol. 2, 1-13, 2008.
29. Khalaj-Amirhosseini, K., "Closed form solutions for nonuniform transmission lines," Progress In Electromagnetics Research B, Vol. 2, 243-258, 2008.
30. Valagiannopoulos, C. A., "On measuring the permittivity tensor of an anisotropic material from the transmission coefficients," Progress In Electromagnetics Research B, Vol. 9, 105-116, 2008.
31. Hasar, U. C. and O. E. Inan, "Elimination of the dependency of the calibration plane and the sample thickness from complex permittivity measurements of thin materials," Microw. Opt. Technol. Lett., Vol. 51, 1642-1646, 2009.
32. Engen, G. F. and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microw. Theory Tech., Vol. 27, 987-993, 1979.
33. Hasar, U. C., "Simple calibration plane-invariant method for com- plex permittivity determination of dispersive and nondispersive low-loss materials," IET Microw. Antennas Propagat., Vol. 3, 630-637,2009.
34. Von Hippel, A. R., Dielectric Materials and Applications, John Wiley & Sons, New York, NY, 1954.