-
1
-
-
19944408370
-
-
C.D. Nicola, A. Galindo, J.V. Hanna, F. Marchetti, C. Pettinari, R. Pettinari, E. Rivarola, B.W. Skelton, A.H. White. Inorg. Chem., 44, 3094 (2005).
-
(2005)
Inorg. Chem.
, vol.44
, pp. 3094
-
-
Nicola, C.D.1
Galindo, A.2
Hanna, J.V.3
Marchetti, F.4
Pettinari, C.5
Pettinari, R.6
Rivarola, E.7
Skelton, B.W.8
White, A.H.9
-
2
-
-
0002750715
-
-
2061
-
R. Baggio, M.T. Garland, Y. Moreno, O. Pena, M. Perec, E. Spodine. J. Chem. Soc., Dalton Trans., 2061 (2000).
-
(2000)
J. Chem. Soc., Dalton Trans.
-
-
Baggio, R.1
Garland, M.T.2
Moreno, Y.3
Pena, O.4
Perec, M.5
Spodine, E.6
-
3
-
-
0039470422
-
-
J.-G. Mao, L. Song, X.-Y. Huang, J.-S. Huang. Polyhedron, 16, 963 (1997).
-
(1997)
Polyhedron
, vol.16
, pp. 963
-
-
Mao, J.-G.1
Song, L.2
Huang, X.-Y.3
Huang, J.-S.4
-
4
-
-
0002429077
-
-
J.-G. Mao, J.-S. Huang, J.F. Ma, J.-Z. Ni. Transition Met. Chem., 22, 277 (1997).
-
(1997)
Transition Met. Chem.
, vol.22
, pp. 277
-
-
Mao, J.-G.1
Huang, J.-S.2
Ma, J.F.3
Ni, J.-Z.4
-
6
-
-
0037152384
-
-
A.C. Rizzi, R. Calvo, R. Baggio, M.T. Garland, O. Pena, M. Perec. Inorg. Chem., 41, 5609 (2002).
-
(2002)
Inorg. Chem.
, vol.41
, pp. 5609
-
-
Rizzi, A.C.1
Calvo, R.2
Baggio, R.3
Garland, M.T.4
Pena, O.5
Perec, M.6
-
7
-
-
19944390452
-
-
D. del Ria, A. Galindo, R. Vicente, C. Mealli, A. Ienco, D. Masi. Dalton Trans., 1813 (2003).
-
(2003)
D. Masi. Dalton Trans.
, pp. 1813
-
-
del Ria, D.1
Galindo, A.2
Vicente, R.3
Mealli, C.4
Ienco, A.5
-
8
-
-
4544234663
-
-
A. Grirrane, A. Pastor, E. Alvarez, C. Mealli, A. Ienco, P. Rosa, F. Montilla, A. Galindo. Eur. J. Inorg. Chem., 707 (2004).
-
(2004)
Eur. J. Inorg. Chem
, vol.707
-
-
Grirrane, A.1
Pastor, A.2
Alvarez, E.3
Mealli, C.4
Ienco, A.5
Rosa, P.6
Montilla, F.7
Galindo, A.8
-
9
-
-
0037465623
-
-
B. Barja, R. Baggio, M.T. Garland, P.F. Aramendia, O. Pena, M. Perec. Inorg. Chim. Acta, 346, 187 (2003).
-
(2003)
Inorg. Chim. Acta
, vol.346
, pp. 187
-
-
Barja, B.1
Baggio, R.2
Garland, M.T.3
Aramendia, P.F.4
Pena, O.5
Perec, M.6
-
10
-
-
0037253813
-
-
T. Behrsing, G.B. Deacon, C.M. Forsyth, M. Forsyth, B.W. Skelton, A.H.Z. White. Z. Anorg. Allg. Chem., 629, 35 (2003).
-
(2003)
Z. Anorg. Allg. Chem
, vol.629
, pp. 35
-
-
Behrsing, T.1
Deacon, G.B.2
Forsyth, C.M.3
Forsyth, M.4
Skelton, B.W.5
White, A.H.Z.6
-
11
-
-
0032216408
-
-
M. Bethencourt, F.I. Botana, J.J. Calvino, M. Marcos, M.A. Rodriguez-Chancon. Corros. Sci., 40, 1803 (1998).
-
(1998)
Corros. Sci.
, vol.40
, pp. 1803
-
-
Bethencourt, M.1
Botana, F.I.2
Calvino, J.J.3
Marcos, M.4
Rodriguez-Chancon, M.A.5
-
12
-
-
0036831386
-
-
M. Forsyth, C.M. Forsyth, K. Wilson, T. Behrsing, G.B. Deacon. Corros. Sci., 44, 2651 (2002).
-
(2002)
Corros. Sci.
, vol.44
, pp. 2651
-
-
Forsyth, M.1
Forsyth, C.M.2
Wilson, K.3
Behrsing, T.4
Deacon, G.B.5
-
14
-
-
0001751908
-
-
R. Baggio, M.T. Garland, M. Perec, D. Vega. Inorg. Chem., 35, 2396 (1996).
-
(1996)
Inorg. Chem.
, vol.35
, pp. 2396
-
-
Baggio, R.1
Garland, M.T.2
Perec, M.3
Vega, D.4
-
18
-
-
0001124653
-
-
F.R. Fronczek, A.K. Banerjee, S.F. Watkins, R.W. Schwartz. Inorg. Chem., 20, 2745 (1981).
-
(1981)
Inorg. Chem.
, vol.20
, pp. 2745
-
-
Fronczek, F.R.1
Banerjee, A.K.2
Watkins, S.F.3
Schwartz, R.W.4
-
19
-
-
31544438842
-
-
J.M. Gonzalez-Perez, C. Alarcon-Payer, A. Castineiras, T. Pivetta, L. Lezama, D. Choquesillo-Lazarte, G. Crisponi, J. Niclos-Gutierrez. Inorg. Chem., 45, 877 (2006).
-
(2006)
Inorg. Chem.
, vol.45
, pp. 877
-
-
Gonzalez-Perez, J.M.1
Alarcon-Payer, C.2
Castineiras, A.3
Pivetta, T.4
Lezama, L.5
Choquesillo-Lazarte, D.6
Crisponi, G.7
Niclos-Gutierrez, J.8
-
20
-
-
33846474146
-
-
B. Li, W. Gu, L.-Z. Zhang, J. Qu, Z.-P. Ma, D.-Z. Liao. Inorg. Chem., 45, 10425 (2006).
-
(2006)
Inorg. Chem.
, vol.45
, pp. 10425
-
-
Li, B.1
Gu, W.2
Zhang, L.-Z.3
Qu, J.4
Ma, Z.-P.5
Liao, D.-Z.6
-
23
-
-
0037728012
-
-
K.P. Mörtl, J.-P. Sutter, S. Golhen, L. Ouahab, O. Kaha. Inorg. Chem., 39, 1626 (2000).
-
(2000)
Inorg. Chem.
, vol.39
, pp. 1626
-
-
Mörtl, K.P.1
Sutter, J.-P.2
Golhen, S.3
Ouahab, L.4
Kaha, O.5
-
26
-
-
0004150157
-
-
v5 Reference Manual Siemens Analytical for X-ray Systems Inc, Madison, Wisconsin, USA
-
G.M. Sheldrick. SHELXTL, v5 Reference Manual Siemens Analytical for X-ray Systems Inc, Madison, Wisconsin, USA (1996).
-
(1996)
SHELXTL
-
-
Sheldrick, G.M.1
-
32
-
-
0035981332
-
-
A. Grirrane, A. Pastor, A. Ienco, C. Mealli, A. Galindo. J. Chem. Soc., Dalton Trans., 3771 (2002).
-
(2002)
J. Chem. Soc., Dalton Trans.
, pp. 3771
-
-
Grirrane, A.1
Pastor, A.2
Ienco, A.3
Mealli, C.4
Galindo, A.5
|