Response of seven crystallographic orientations of sapphire crystals to shock stresses of 16-86 GPa

Journal of Applied Physics

Volumn 106, Issue 4, 2009, Pages

  Kanel, G I ^a   Nellis, W J ^b   Savinykh, A S ^c   Razorenov, S V ^c   Rajendran, A M ^d  

^a JOINT INSTITUTE FOR HIGH TEMPERATURES   (Russian Federation)

^b HARVARD UNIVERSITY   (United States)

^c INSTITUTE OF PROBLEMS OF CHEMICAL PHYSICS   (Russian Federation)

^d UNIVERSITY OF MISSISSIPPI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASAL PLANES; CRYSTALLOGRAPHIC ORIENTATIONS; ELASTIC-PLASTIC; HUGONIOT ELASTIC LIMIT; INDUCED TRANSPARENCY; LOAD DURATION; MECHANICAL SHOCK; OPTICAL TRANSPARENCY; PARTICLE VELOCITIES; PEAK STRESS; RISETIMES; SAPPHIRE CRYSTAL; SHOCK COMPRESSIONS; SHOCK LOADINGS; SHOCK PRESSURE; SHOCK PROPAGATION; SHOCK STRESS; SINGLE-CRYSTAL; SPALL STRENGTH; TIME-RESOLVED; VELOCITY INTERFEROMETER; WAVE PROFILES; WINDOW MATERIALS;

ACOUSTIC WAVE PROPAGATION; CORUNDUM; CRYSTAL STRUCTURE; DEFORMATION; INTERFEROMETERS; INTERFEROMETRY; PLASTICS; SEMICONDUCTOR INSULATOR BOUNDARIES; SHOCK WAVES; TENSILE STRENGTH; TRANSPARENCY; WAVES; WINDOWS;

SAPPHIRE;

EID: 69749091036     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3204940     Document Type: Article

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