Determination of three-dimensional orientations of ferroelectric single crystals by an improved rotating orientation x-ray diffraction method

Review of Scientific Instruments

Volumn 80, Issue 8, 2009, Pages

  Li, Fei ^a   Jin, Li ^b   Xu, Zhuo ^a   Guo, Zhenqi ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC ORIENTATIONS; CRYSTALLOGRAPHIC PLANE; FERROELECTRIC SINGLE CRYSTALS; GEOMETRIC RELATIONSHIPS; LABORATORY EQUIPMENTS; THREE-DIMENSIONAL ORIENTATION; TWO STEP METHOD; X-RAY DIFFRACTION METHOD; XRD;

CRYSTAL ORIENTATION; DIFFRACTION; FERROELECTRICITY; HOLOGRAPHIC INTERFEROMETRY; NIOBIUM; ROTATION; THREE DIMENSIONAL; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SINGLE CRYSTALS;

EID: 69749089777     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3204781     Document Type: Article

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