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Volumn 267, Issue 6, 2009, Pages 973-975

Oxygen defects created in CeO2 irradiated with 200 MeV Au ions

Author keywords

Electronic energy deposition; High energy ion irradiation; Oxygen vacancy; Radiation damage; Raman spectroscopy; Thermal annealing

Indexed keywords

ANNEALED SAMPLES; BAND INTENSITY; BROAD BANDS; ELECTRONIC ENERGY DEPOSITION; HIGH-ENERGY ION IRRADIATION; HIGHER FREQUENCIES; IN-VACUUM; ION FLUENCES; IRRADIATED FILMS; IRRADIATED SAMPLES; LOW FREQUENCY; OXYGEN DEFECT; RAMAN SPECTRA; SPECTRAL CHANGE; THERMAL ANNEALING;

EID: 69749087621     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.02.034     Document Type: Article
Times cited : (31)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.