Growth and characterization of ferroelectric-ferroelastic Tb 2(MoO4)3 crystals

Crystal Research and Technology

Volumn 44, Issue 9, 2009, Pages 1001-1004

  Cai, Guipeng ^a   Wang, Jiyang ^a   Zhang, Huaijin ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

Czochralski method; Etching; Ferroelectric materials; Terbium molybdate

Indexed keywords

AS-GROWN; CZOCHRALSKI METHOD; CZOCHRALSKI METHODS; ETCHING TECHNIQUE; FERROELASTICS; FERROELECTRIC DOMAIN STRUCTURE; HIGH RESOLUTION X RAY DIFFRACTION; OPTICAL MICROSCOPES; OPTICAL QUALITIES; OPTICAL TRANSPARENCY; SINGLE PHASE; VISIBLE AND NEAR INFRARED; X-RAY POWDER DIFFRACTION;

CRYSTAL STRUCTURE; DIFFRACTION; ETCHING; FERROELECTRIC DEVICES; FERROELECTRICITY; GADOLINIUM; LIGHT TRANSMISSION; NEGATIVE IONS; SINGLE CRYSTALS; TERBIUM; TERBIUM ALLOYS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC MATERIALS;

EID: 69549088458     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200900408     Document Type: Article

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