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Volumn 7309, Issue , 2009, Pages

Safe VISITOR: VISible, infrared and terahertz object recognition for security screening application

Author keywords

Bolometer; Camera; Imaging; Terahertz; TES; THz

Indexed keywords

APPLICATION SCENARIO; ERROR RATE; FIELD TRIAL; HIDDEN OBJECTS; HIGHER FREQUENCIES; IMAGE SCENE; IMAGING; LONG INFRARED; MICROBOLOMETER; MM-WAVE; OPTICAL APERTURE; OPTICAL RESOLUTION; SECURITY CAMERAS; SECURITY SCREENING; SECURITY SOLUTIONS; SHORTER WAVELENGTH; STAND-OFF; SUPERCONDUCTING BOLOMETERS; TEMPERATURE RESOLUTION; TERAHERTZ; TES; THZ; TRANSMISSION PROPERTY; VISIBLE LIGHT;

EID: 69549084866     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.818524     Document Type: Conference Paper
Times cited : (23)

References (5)
  • 1
    • 4043082603 scopus 로고    scopus 로고
    • Millimeter-wave, terahertz, and midinfrared transmission through common clothing
    • J.E. Bjarnason, T.L.J. Chan, A.W.M. Lee, M.A. Celis, E.R. Brown, "Millimeter-wave, terahertz, and midinfrared transmission through common clothing", Appl. Phys. Lett. 85(4), 519-521(2004).
    • (2004) Appl. Phys. Lett. , vol.85 , Issue.4 , pp. 519-521
    • Bjarnason, J.E.1    Chan, T.L.J.2    Lee, A.W.M.3    Celis, M.A.4    Brown, E.R.5
  • 4
    • 0001151807 scopus 로고    scopus 로고
    • Measurements of thermal transport in low stress silicon nitride films
    • W. Holmes, J. M. Gildemeister, and P. L. Richards, V. Kotsubo, "Measurements of thermal transport in low stress silicon nitride films", Applied Physics Letters Vol.72, No. 18, 2250 (1998).
    • (1998) Applied Physics Letters , vol.72 , Issue.18 , pp. 2250
    • Holmes, W.1    Gildemeister, J.M.2    Richards, P.L.3    Kotsubo, V.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.