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Volumn 13, Issue 11, 2009, Pages 1639-1644
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Ellipsometric study of oxide formation on Cu electrode in 0.1 M NaOH
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Author keywords
[No Author keywords available]
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Indexed keywords
CU ELECTRODE;
CUPRIC OXIDE;
EFFECTIVE MEDIUM APPROXIMATION;
FITTING METHOD;
JOINT IMPEDANCE;
LAYER FORMATION;
LEVENBERG-MARQUARDT OPTIMIZATION;
MODEL FITTING;
NAOH SOLUTIONS;
OXIDE FORMATION;
OXIDE GROWTH;
PASSIVATION PROCESS;
SINGLE WAVELENGTH ELLIPSOMETRIES;
STRUCTURE FORMATIONS;
APPROXIMATION ALGORITHMS;
CYCLIC VOLTAMMETRY;
ELECTRIC PROPERTIES;
ELLIPSOMETRY;
MULTILAYER FILMS;
MULTILAYERS;
PASSIVATION;
COPPER OXIDES;
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EID: 69549083478
PISSN: 14328488
EISSN: None
Source Type: Journal
DOI: 10.1007/s10008-008-0650-z Document Type: Conference Paper |
Times cited : (29)
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References (22)
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