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Volumn 42, Issue 20, 2004, Pages 3759-3765

A study on crystalline residual stress of the iPP surface layer in Al/iPP/Al under the influence of microwave irradiation

Author keywords

Irradiation; Isotactic poly(propylene); Stress; X ray

Indexed keywords

CRYSTAL LATTICES; CRYSTALLINE MATERIALS; MICROWAVES; PLASTIC DEFORMATION; RESIDUAL STRESSES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION;

EID: 6944246269     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.20240     Document Type: Article
Times cited : (1)

References (13)
  • 3
    • 6944256564 scopus 로고
    • M.S. Thesis, Massachusetts Institute of Technology, Boston, MA
    • Ogilvey, R. E.; M.S. Thesis, Massachusetts Institute of Technology, Boston, MA, 1952.
    • (1952)
    • Ogilvey, R.E.1
  • 4
    • 0039406183 scopus 로고
    • Residual Stress Measurement by X-ray Diffraction
    • Ed. SAE J784a, 21-24
    • Residual Stress Measurement by X-ray Diffraction, Hilley, M. E., Ed.; SAE J784a, 21-24, Soc. of Auto. Engrs., 1971.
    • (1971) Soc. of Auto. Engrs.
    • Hilley, M.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.