Modeling, measuring, and minimizing the instrument response function of a tunable diode laser spectrometer

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 91, Issue 4, 2005, Pages 453-484

  Sauke, Todd B ^a   Becker, Joseph F ^b  

^a NASA AMES RESEARCH CENTER   (United States)

^b SAN JOSE STATE UNIVERSITY   (United States)

Author keywords

Instrument response function; IRF; Spectrometer; TDL; Tunable diode laser

Indexed keywords

ABSORPTION; GAUSSIAN NOISE (ELECTRONIC); NOISE ABATEMENT; SIGNAL TO NOISE RATIO; SPECTROMETERS; SPECTRUM ANALYSIS;

INSTRUMENT RESPONSE FUNCTION (IRF); SPECTRAL DATA; SPECTROSCOPIC PARAMETERS; TUNABLE LASER DIODE SPECTROMETERS;

SEMICONDUCTOR LASERS;

SPECTROMETER;

EID: 6944239876     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jqsrt.2004.07.005     Document Type: Article

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