Scanning tunnel microscopy surface state electron scattering: Two-tip results from one-tip data

Physical Review Letters

Volumn 78, Issue 13, 1997, Pages 2570-2572

  Chan, YickStella ^a   Heller, E J ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BOUNDARY CONDITIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC DENSITY OF STATES; GREEN'S FUNCTION; INVERSE PROBLEMS; LEAST SQUARES APPROXIMATIONS; SCANNING TUNNELING MICROSCOPY; TRANSCONDUCTANCE;

SINGULAR VALUE DECOMPOSITION; TWO TIP DATA;

ELECTRON SCATTERING;

EID: 6944224250     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.2570     Document Type: Article

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