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Volumn 30, Issue 9, 2009, Pages 1510-1515

Sample stacking in CZE using dynamic thermal junctions II: Analytes with high dpKa/dT crossing a single thermal junction in a BGE with low dpH/dT

Author keywords

Amino acids; Band compression; CZE; Sample stacking; Thermal junctions

Indexed keywords

ALKALINITY; ELECTRIC FIELDS; ELECTROPHORETIC MOBILITY; NAPHTHALENE; TEMPERATURE DISTRIBUTION;

EID: 69249242817     PISSN: 01730835     EISSN: 15222683     Source Type: Journal    
DOI: 10.1002/elps.200800585     Document Type: Article
Times cited : (5)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.