Effects of AlN layer thickness on magnetic anisotropy and transport phenomena of CoPt/AlN layered structure

Vacuum

Volumn 84, Issue 1, 2009, Pages 158-161

  Yu, Youxing ^a   Hodumi, Yasuaki ^a   Shi, Ji ^a   Nakamura, Yoshio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

CoPt AlN multilayer; Perpendicular magnetic anisotropy; Thermal annealing

Indexed keywords

ALN; ALN LAYERS; COPT/ALN MULTILAYER; FOUR-PROBE METHODS; IN-PLANE MAGNETIC ANISOTROPY; INTERFACE ANISOTROPY; LAYERED STRUCTURES; MAGNETIC ISOTROPY; MAGNETOCRYSTALLINE ANISOTROPY ENERGIES; MULTI-LAYERED FILMS; PERPENDICULAR MAGNETIC ANISOTROPY; SMOOTH INTERFACE; STRUCTURE ANALYSIS; THERMAL ANNEALING; TRANSPORT PHENOMENA;

ANNEALING; MAGNETIC MULTILAYERS; MAGNETISM; PNEUMATIC CONTROL EQUIPMENT; TRANSPORT PROPERTIES;

MAGNETIC ANISOTROPY;

EID: 69249212254     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.04.034     Document Type: Article

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