Characterization of CdSe films prepared by chemical bath deposition method

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 2, Issue 2, 2008, Pages 92-98

  Metin, H ^a   Erat, S ^a   Ari, M ^b   Bozoklu, M ^b  

^a MERSIN UNIVERSITY   (Turkey)

^b ERCIYES UNIVERSITY   (Turkey)

Author keywords

CdSe; Characterization; Four point probe method; Thin film

Indexed keywords

ACTIVATION ENERGY; DEPOSITION; ELECTRIC CONDUCTIVITY; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY GAP; II-VI SEMICONDUCTORS; OPTICAL DATA PROCESSING; PROBES; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; TEMPERATURE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CDSE; CHEMICAL BATH DEPOSITION METHODS; ENERGY DISPERSIVE X-RAY ANALYSIS (EDX); FOUR-POINT PROBE METHOD; STRUCTURAL AND ELECTRICAL PROPERTIES; TEMPERATURE COEFFICIENT OF ELECTRICAL RESISTIVITY; THE SCANNING ELECTRON MICROSCOPES (SEM); UV-VISIBLE SPECTROPHOTOMETER;

CADMIUM COMPOUNDS;

EID: 69249130554     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

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