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Journal of Analytical Atomic Spectrometry

Volumn 24, Issue 9, 2009, Pages 1237-1243

In situ Sr isotopic analysis of low Sr silicates using LA-ICP-MS

(5) Jochum, K P a Stoll, B a Weis, U a Kuzmin, D V a,b Sobolev, A V a,c

a MAX PLANCK INSTITUTE FOR CHEMISTRY (Germany)

b TROFIMUK INSTITUTE OF PETROLEUM GEOLOGY AND GEOPHYSICS (Russian Federation)

c VERNADSKY INSTITUTE OF GEOCHEMISTRY AND ANALYTICAL CHEMISTRY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

A-SPOTS; DEAD TIME; GLASS FRAGMENTS; GLASSY MELTS; HIGH SENSITIVITY; HIGH-PRECISION; IN-SITU; ION COUNTING SYSTEMS; ISOBARIC INTERFERENCES; ISOTOPE MEASUREMENTS; ISOTOPIC ANALYSIS; LA-ICP-MS; LA-ICP-MS TECHNIQUE; MASS DISCRIMINATION; ND : YAG LASERS; OCEANIC BASALTS; REFERENCE GLASS; SCAN MODE; SR ISOTOPIC ANALYSIS; SR SILICATE; UNCERTAINTY LIMITS;

DIFFUSERS (OPTICAL); GLASS; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ISOTOPES; KRYPTON; LASER ABLATION; MASS SPECTROMETERS; NEODYMIUM LASERS; SILICATES;

STRONTIUM;

EID: 69249122959 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b905045k Document Type: Conference Paper

Times cited : (34)

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