Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces

Electrochimica Acta

Volumn 54, Issue 25, 2009, Pages 6058-6062

  Rohwerder, M ^a   Isik Uppenkamp, S ^a   Stratmann, M ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

Diffusion; Interface; Ion migration; Kelvin Probe; Mobility

Indexed keywords

ELECTROCHEMICAL PROCESS; IN-SITU; IN-SITU MONITORING; INSULATING SUBSTRATES; INTERFACE; ION MIGRATION; ION MOBILITY; KELVIN PROBE; MOBILITY; SCANNING KELVIN PROBE TECHNIQUES; SUPER CAPACITOR;

BUILDING MATERIALS; DIFFUSION; PROBES;

IONS;

EID: 69249097855     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2009.03.012     Document Type: Article

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