Combinatorial (Ba,Sr) TiO3 thin film growth: X-ray diffraction and Raman spectroscopy

Journal of Applied Physics

Volumn 106, Issue 3, 2009, Pages

  Bouyanfif, H ^a   Wolfman, J ^a   El Marssi, M ^b   Yuzyuk, Y ^b,d   Bodeux, R ^a,c   Gervais, M ^a   Gervais, F ^a  

^a UNIVERSITÉ DE TOURS   (France)

^b Universite de Picardie Jules Verne   (France)

^c STMICROELECTRONICS   (France)

^d SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BULK COUNTERPART; BULK PHASE DIAGRAMS; COMBINATORIAL METHOD; ELASTIC INTERACTIONS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HIGH RESOLUTION X RAY DIFFRACTION; MGO SUBSTRATE; MICROWAVE APPLICATIONS; POLAR MODES; SOFT MODES; SPATIAL CONTROL; SRTIO; SYMMETRY CHANGES; TETRAGONAL DISTORTION; TIO;

BARIUM; DIFFRACTION; FILM GROWTH; HARDENING; PHASE DIAGRAMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SETTLING TANKS; STOICHIOMETRY; STRONTIUM; X RAY DIFFRACTION;

BARIUM COMPOUNDS;

EID: 69149101588     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3190478     Document Type: Article

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