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Volumn 106, Issue 3, 2009, Pages

Ambient induced degradation and chemically activated recovery in copper phthalocyanine thin film transistors

(9) Park, Jeongwon a Royer, James E a Colesniuc, Corneliu N a Bohrer, Forest I a Sharoni, Amos a Jin, Sungho a Schuller, Ivan K a Trogler, William C a Kummel, Andrew C a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT AIR; BOTTOM CONTACTS; CHANNEL DEVICE; COPPER PHTHALOCYANINE; DRY AIR; ELECTRICAL DEGRADATION; ELECTRICAL EFFECTS; FILM MICROSTRUCTURES; INDUCED DEGRADATION; ORGANIC THIN FILM TRANSISTORS; SATURATION BEHAVIOR; STRONG OXIDANTS; SUB-THRESHOLD BEHAVIOR; ULTRA-THIN;

ADSORPTION; DEGRADATION; GRAIN BOUNDARIES; MONOLAYERS; NITROGEN COMPOUNDS; THIN FILM TRANSISTORS; THIN FILMS;

FIELD EFFECT TRANSISTORS;

EID: 69149093564 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3159885 Document Type: Article

Times cited : (29)

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