Mechanism of slow relaxation due to screening effect in a frustrated system

Journal of the Physical Society of Japan

Volumn 78, Issue 8, 2009, Pages

  Tanaka, Shu ^a   Miyashita, Seiji ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Decorated bond system; Entropy effect; Frustration; Ising Spin system; Slow relaxation

Indexed keywords

EID: 69149083073     PISSN: 00319015     EISSN: 13474073     Source Type: Journal    
DOI: 10.1143/JPSJ.78.084002     Document Type: Article

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