A novel method based on wavelet threshold de-noising technology and prony analysis for flicker measurement

Proceedings of the Universities Power Engineering Conference

Volumn , Issue , 2008, Pages

  Zhang, Youbing ^a   Chen, Quan ^a   Liu, Jianxiong ^a   Hu, Yi ^a   Cao, Yijia ^b  

^a ZHEJIANG UNIVERSITY OF TECHNOLOGY   (China)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DE-NOISING; FLICKER MEASUREMENT; FREQUENCY COMPONENTS; LINEAR COMBINATIONS; NOVEL METHODS; ORTHOGONAL SIGNALS; PHASE ANGLES; PRONY ALGORITHM; PRONY ANALYSIS; VOLTAGE FLICKERS; VOLTAGE FLUCTUATIONS; WAVELET THRESHOLD;

ELECTRIC POTENTIAL;

EID: 68949197347     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/UPEC.2008.4651602     Document Type: Conference Paper

References (11)

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