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Volumn 44, Issue 19, 2009, Pages 5339-5344
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Orientation controlled deposition of Pb(Zr,Ti)O3 films using a micron-size patterned SrRuO3 buffer layer
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR;
CONTROLLED DEPOSITION;
DOT PATTERNS;
FERROELECTRIC PROPERTY;
METAL MASKS;
METAL ORGANIC;
MOCVD;
PB(ZR ,TI)O;
PZT;
PZT FILM;
SI SUBSTRATES;
X- RAY DIFFRACTION;
BUFFER LAYERS;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL ORIENTATION;
FILM PREPARATION;
LEAD;
ORGANIC CHEMICALS;
ORGANOMETALLICS;
PIEZOELECTRIC ACTUATORS;
PIEZOELECTRIC MATERIALS;
PIEZOELECTRIC TRANSDUCERS;
PLATINUM;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SEMICONDUCTING LEAD COMPOUNDS;
ZIRCONIUM;
SUBSTRATES;
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EID: 68949191023
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-009-3683-5 Document Type: Article |
Times cited : (2)
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References (16)
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