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Volumn 48, Issue 16, 2009, Pages 7714-7728

On the reactivity of F3S≡NXeF+: Syntheses and structural characterizations of [F4S=N-Xe - N≡SF 3][AsF6], a rare example of a N-Xe-N Linkage, and [F 3S(N≡SF3)2][AsF6]

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Indexed keywords


EID: 68949130862     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic900651n     Document Type: Article
Times cited : (21)

References (62)
  • 21
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    • The presence of CIS-N2F2 was established from its Raman bands at 354(co, 729(sh, 888(co, 946(5, and 1519(co) cm, where the abbreviations denote coincidence (co) and shoulder (sh, The bands at 354 and 888 cm- are coincident with the [δ(N1S1F2, δ(F1S1F3, δ(N2S2F6, δ(F4S2F5, and [δ(S1F2-S1F3, δ(S2F6-S2F4, bands of F3S, N≡SF3)2, and the band at 1519 cm -1 is coincident with the v(S≡N) band of unreacted F4S=N-Xe, N≡SF3, The presence of cis-N2F2 after pumping at -50 °C was surprising in view of the vapor-pressure of CIS-N2F2 at -50 °C 1.19 × 104 mm Hg, suggesting it may be adducted to unreacted F4S=NXe+ remaining in the product mixture: Zaborowski, L. M, De Marco, R. A
    • + remaining in the product mixture: Zaborowski, L. M.; De Marco, R. A.; Shreeve, J. M. Inorg. Chem. 1973, 14, 34-39.
  • 30
    • 68949120448 scopus 로고    scopus 로고
    • Thesis, McMaster University, Hamilton, ON
    • Fir, B. A. M. Sc. Thesis, McMaster University, Hamilton, ON, 1999.
    • (1999)
    • Fir, B.A.M.S.1
  • 35
    • 33947472578 scopus 로고    scopus 로고
    • 34 which is similar to the data collection temperature used for the present work (-173 C). Moreover, the X-ray crystal structure is more precise than the microwave structure and is used for comparison in the present discussion.
    • 34 which is similar to the data collection temperature used for the present work (-173 C). Moreover, the X-ray crystal structure is more precise than the microwave structure and is used for comparison in the present discussion.
  • 46
    • 68949132084 scopus 로고    scopus 로고
    • This work
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    • Sheldrick, G. M. SADABS (Siemens Area Detector Absorption Corrections), version 2.10; Siemens Analytical X-ray Instruments, Inc.: Madison, WI, 2004.
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    • Sheldrick, G. M. SHELXTL-Plus, release 6.14; Siemens Analytical X-ray Instruments, Inc.: Madison, WI, 2000-2003.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.