Bias-controlled sensitivity of ferromagnet/semiconductor electrical spin detectors

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 4, 2009, Pages

  Crooker, S A ^a   Garlid, E S ^b   Chantis, A N ^a   Smith, D L ^a   Reddy, K S M ^b   Hu, Q O ^b   Kondo, T ^b,d   Palmstrom C J ^b,c   Crowell, P A ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b University of Minnesota   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 68949127331     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.041305     Document Type: Article

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