-
1
-
-
0037375314
-
-
AgraÏt, N.; Levy Yeyati, A.; van Ruitenbeek, J. M. Phys. Rep. 2003, 377, 81-279.
-
(2003)
Phys. Rep
, vol.377
, pp. 81-279
-
-
AgraÏt, N.1
Levy Yeyati, A.2
van Ruitenbeek, J.M.3
-
2
-
-
19644383317
-
-
Xie, F.-Q.; Nittler, L.; Obermair, Ch.; Schimmel, Th. Phys. Rev. Lett. 2004, 93, 128303.
-
(2004)
Phys. Rev. Lett
, vol.93
, pp. 128303
-
-
Xie, F.-Q.1
Nittler, L.2
Obermair, C.3
Schimmel, T.4
-
3
-
-
61649120801
-
-
Xie, F.-Q.; Maul, R.; Augenstein, A.; Obermair, Ch.; Starikov, E. B.; Schön, G.; Schimmel, Th.; Wenzel, W. Nano Lett. 2008, 8, 4493-4497.
-
(2008)
Nano Lett
, vol.8
, pp. 4493-4497
-
-
Xie, F.-Q.1
Maul, R.2
Augenstein, A.3
Obermair, C.4
Starikov, E.B.5
Schön, G.6
Schimmel, T.7
Wenzel, W.8
-
4
-
-
58149508535
-
-
Klein, M.; Lansbergen, G. P.; Mol, J. A.; Rogge, S.; Levine, R. D.; Remacle, F. ChemPhysChem 2009, 10, 162-173.
-
(2009)
ChemPhysChem
, vol.10
, pp. 162-173
-
-
Klein, M.1
Lansbergen, G.P.2
Mol, J.A.3
Rogge, S.4
Levine, R.D.5
Remacle, F.6
-
5
-
-
1942512141
-
-
Dulić, D.; van der Molen, S. J.; Kudernac, T.; Jonkman, H. T.; de Jong, J. J. D.; Bowden, T. N.; van Esch, J.; Feringa, B. L.; van Wees, B. J. Phys. Rev. Lett. 2003, 91, 207402.
-
(2003)
Phys. Rev. Lett
, vol.91
, pp. 207402
-
-
Dulić, D.1
van der Molen, S.J.2
Kudernac, T.3
Jonkman, H.T.4
de Jong, J.J.D.5
Bowden, T.N.6
van Esch, J.7
Feringa, B.L.8
van Wees, B.J.9
-
6
-
-
35548980968
-
-
Whalley, A. C.; Steigerwald, M. L.; Guo, X.; Nuckolls, C. J. Am. Chem. Soc. 2007, 129, 12590-12591.
-
(2007)
J. Am. Chem. Soc
, vol.129
, pp. 12590-12591
-
-
Whalley, A.C.1
Steigerwald, M.L.2
Guo, X.3
Nuckolls, C.4
-
7
-
-
33747166708
-
-
Lörtscher, E.; Ciszek, J. W.; Tour, J.; Riel, H. Small 2006, 2, 973-977.
-
(2006)
Small
, vol.2
, pp. 973-977
-
-
Lörtscher, E.1
Ciszek, J.W.2
Tour, J.3
Riel, H.4
-
8
-
-
64449083038
-
-
Quek, S. Y.; Kamenetska, M.; Steigerwald, M. L.; Choi, H. J.; Louie, S. G.; Hybertsen, M. S.; Neaton, J. B.; Venkataraman, L. Nat. Nanotechnol. 2009, 4, 230-234.
-
(2009)
Nat. Nanotechnol
, vol.4
, pp. 230-234
-
-
Quek, S.Y.1
Kamenetska, M.2
Steigerwald, M.L.3
Choi, H.J.4
Louie, S.G.5
Hybertsen, M.S.6
Neaton, J.B.7
Venkataraman, L.8
-
10
-
-
7544219500
-
-
Lee, S. W.; Lee, D. S.; Morjan, R. E.; Jhang, S. H.; Sveningsson, M.; Nerushev, O. A.; Park, Y. W.; Campbell, E. E. B. Nano Lett. 2004, 4, 2027-2030.
-
(2004)
Nano Lett
, vol.4
, pp. 2027-2030
-
-
Lee, S.W.1
Lee, D.S.2
Morjan, R.E.3
Jhang, S.H.4
Sveningsson, M.5
Nerushev, O.A.6
Park, Y.W.7
Campbell, E.E.B.8
-
11
-
-
40849092892
-
-
Jang, W. W.; Lee, J. O.; Yoon, J.-B.; Kim, M.-S.; Lee, J.-M.; Kim, S. M.; Cho, K.-H.; Kim, D.-W.; Park, D.; Lee, W.-S. Appl. Phys. Lett. 2008, 92, 103110.
-
(2008)
Appl. Phys. Lett
, vol.92
, pp. 103110
-
-
Jang, W.W.1
Lee, J.O.2
Yoon, J.-B.3
Kim, M.-S.4
Lee, J.-M.5
Kim, S.M.6
Cho, K.-H.7
Kim, D.-W.8
Park, D.9
Lee, W.-S.10
-
12
-
-
14644407420
-
-
Champagne, A. R.; Pasupathy, A. N.; Ralph, D. C. Nano Lett. 2005, 5, 305-308.
-
(2005)
Nano Lett
, vol.5
, pp. 305-308
-
-
Champagne, A.R.1
Pasupathy, A.N.2
Ralph, D.C.3
-
13
-
-
47149093758
-
-
Martin, C. A.; Ding, D.; van der Zant, H. S. J.; van Ruitenbeek, J. M. New J. Phys. 2008, 10, 065008.
-
(2008)
New J. Phys
, vol.10
, pp. 065008
-
-
Martin, C.A.1
Ding, D.2
van der Zant, H.S.J.3
van Ruitenbeek, J.M.4
-
14
-
-
68949093023
-
-
A further reduction of the gap size is hindered by dewetting of the precursor solution at higher dilutions
-
A further reduction of the gap size is hindered by dewetting of the precursor solution at higher dilutions .
-
-
-
-
15
-
-
43049092621
-
-
Trouwborst, M. L.; Huisman, E. H.; Bakker, F. L.; van der Molen, S. J.; van Wees, B. J. Phys. Rev. Lett. 2008, 100, 175502.
-
(2008)
Phys. Rev. Lett
, vol.100
, pp. 175502
-
-
Trouwborst, M.L.1
Huisman, E.H.2
Bakker, F.L.3
van der Molen, S.J.4
van Wees, B.J.5
-
16
-
-
15444365147
-
-
Vrouwe, S. A. G.; van der Giessen, E.; van der Molen, S. J.; Dulic, D.; Trouwborst, M. L.; van Wees, B. J. Phys. Rev. B 2005, 71, 035313.
-
(2005)
Phys. Rev. B
, vol.71
, pp. 035313
-
-
Vrouwe, S.A.G.1
van der Giessen, E.2
van der Molen, S.J.3
Dulic, D.4
Trouwborst, M.L.5
van Wees, B.J.6
-
17
-
-
68949118725
-
-
We note that the gated junctions were usually found to be stable up to gate voltages of 20 V, i.e, beyond the values reported in ref 12. This difference can be attributed to the use of a local gate electrode instead of a common back gate
-
We note that the gated junctions were usually found to be stable up to gate voltages of 20 V, i.e., beyond the values reported in ref 12. This difference can be attributed to the use of a local gate electrode instead of a common back gate.
-
-
-
-
19
-
-
17444404224
-
-
Chowdhury, S.; Ahmadi, M.; Miller, W. C. J. Micromech. Microeng. 2005, 15, 756-763.
-
(2005)
J. Micromech. Microeng
, vol.15
, pp. 756-763
-
-
Chowdhury, S.1
Ahmadi, M.2
Miller, W.C.3
-
20
-
-
68949142643
-
-
0, the switching can be modified through a rearrangement of the atoms at the tips of the electrodes.
-
0, the switching can be modified through a rearrangement of the atoms at the tips of the electrodes.
-
-
-
-
21
-
-
54749126281
-
-
Waitz, R.; Schecker, O.; Scheer, E. Rev. Sci. Instrum. 2008, 79, 093901.
-
(2008)
Rev. Sci. Instrum
, vol.79
, pp. 093901
-
-
Waitz, R.1
Schecker, O.2
Scheer, E.3
-
22
-
-
63549143878
-
-
Prins, F.; Hayashi, T.; de Vos van Steenwijk, B. J. A.; Gao, B.; Osorio, E. A.; Muraki, K.; van der Zant, H. S. J. Appl. Phys. Lett. 2009, 94, 123108.
-
(2009)
Appl. Phys. Lett
, vol.94
, pp. 123108
-
-
Prins, F.1
Hayashi, T.2
de Vos van Steenwijk, B.J.A.3
Gao, B.4
Osorio, E.A.5
Muraki, K.6
van der Zant, H.S.J.7
-
23
-
-
54749131071
-
-
Osorio, E. A.; Bjørnholm, T.; Lehn, J.-M.; Ruben, M.; van der Zant, H. S. J. J. Phys.: Condens. Matter 2008, 20, 374121.
-
(2008)
J. Phys.: Condens. Matter
, vol.20
, pp. 374121
-
-
Osorio, E.A.1
Bjørnholm, T.2
Lehn, J.-M.3
Ruben, M.4
van der Zant, H.S.J.5
|