Design and performance analysis of emulator for standard conformance test of active RFID

ETRI Journal

Volumn 31, Issue 4, 2009, Pages 376-386

  Song, Taeseung ^a   Lee, Wangsang ^a   Kim, Taeyeon ^b   Lyou, Joon ^b  

^a Korea Testing Laboratory   (South Korea)

^b Chungnam National University   (South Korea)

Author keywords

Active RFID; Conformance test; Emulator; Measurement uncertainty; Reader; Selfrunning test mode; Tag

Indexed keywords

ACTIVE RFID; CONFORMANCE TEST; EMULATOR; MEASUREMENT UNCERTAINTY; READER; SELFRUNNING TEST MODE; TAG;

RADIO FREQUENCY IDENTIFICATION (RFID); RADIO NAVIGATION; SIMULATORS; STANDARDIZATION; TESTING;

UNCERTAINTY ANALYSIS;

EID: 68949094524     PISSN: 12256463     EISSN: None     Source Type: Journal    
DOI: 10.4218/etrij.09.0108.0595     Document Type: Article

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