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Volumn 80, Issue 7, 2009, Pages
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Development of a local vacuum system for focused ion beam machining
b
TOYO UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
BEAM LINES;
CURRENT FLOWS;
FOCUS ADJUSTMENT;
FOCUSED ION BEAM MACHINING;
SHAPE RECOGNITION;
VACUUM APPARATUS;
VACUUM SYSTEM;
VISUALIZATION SYSTEM;
WORK PIECES;
CYLINDERS (SHAPES);
MACHINING;
VACUUM;
FOCUSED ION BEAMS;
ARTICLE;
CONFOCAL MICROSCOPY;
INSTRUMENTATION;
MICROTECHNOLOGY;
PRESSURE;
TIME;
VACUUM;
MICROSCOPY, CONFOCAL;
MICROTECHNOLOGY;
PRESSURE;
TIME FACTORS;
VACUUM;
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EID: 68949083242
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3186060 Document Type: Article |
Times cited : (2)
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References (5)
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