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Volumn 51, Issue 6, 2009, Pages 405-411
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Computed tomography metrology in industrial research and development
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Author keywords
[No Author keywords available]
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Indexed keywords
INDUSTRIAL RESEARCH;
NONDESTRUCTIVE EXAMINATION;
RESEARCH AND DEVELOPMENT MANAGEMENT;
TOMOGRAPHY;
UNCERTAINTY ANALYSIS;
DIMENSIONAL MEASUREMENTS;
INDUSTRIAL INSPECTIONS;
MEASUREMENT UNCERTAINTY;
MEASURING DEVICE;
NON DESTRUCTIVE TESTING;
RESEARCH AND DEVELOPMENT;
COMPUTERIZED TOMOGRAPHY;
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EID: 68749113828
PISSN: 00255300
EISSN: None
Source Type: Journal
DOI: 10.3139/120.110053 Document Type: Article |
Times cited : (16)
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References (4)
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