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Volumn 19, Issue 3, 2009, Pages 670-675

Progress in design of improved high dynamic range analog-to-digital converters

Author keywords

Analog to digital converters; Dynamic range; Quarter rate quantizer

Indexed keywords

ANALOG-TO-DIGITAL CONVERTERS; DECIMATION FILTER; DYNAMIC RANGE; FABRICATION PROCESS; HIGH DYNAMIC RANGE; LOW-PASS; MULTI RATE; MULTI-BITS; MULTI-CHANNEL; OUTPUT CHANNELS; PARALLEL COUNTERS; PERFORMANCE ENHANCEMENTS; PROTOTYPE VERSIONS; QUANTIZERS; QUARTER-RATE; QUARTER-RATE QUANTIZER; SAMPLING FREQUENCIES; SIMULATION RESULT; SINGLE CHANNELS; SINUSOIDAL INPUT; SPUR-FREE DYNAMIC RANGE; TRANSPORT RATE; TWO CHANNEL;

EID: 68649118790     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2017767     Document Type: Conference Paper
Times cited : (42)

References (9)
  • 1
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    • Superconductive high-resolution A/D converter with phase modulation and multi-channel timing arbitration
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  • 4
    • 78650759825 scopus 로고    scopus 로고
    • Superconductor analog to digital converter for SIGINT applications
    • submitted for publication
    • A. Inamdar, D. Gupta, and T. V. Filippov et al., "Superconductor analog to digital converter for SIGINT applications," in MILCOM-08, submitted for publication.
    • MILCOM-08
    • Inamdar, A.1    Gupta, D.2    Filippov, T.V.3
  • 8
    • 34547400564 scopus 로고    scopus 로고
    • Quarter-rate superconducting modulator for improved high resolution analog-to-digital converter
    • June
    • A. Inamdar, S. Rylov, A. Sahu, S. Sarwana, and D. Gupta, "Quarter-rate superconducting modulator for improved high resolution analog-to-digital converter," IEEE Trans. Appl. Supercond., vol. 17, pp. 446-450, June 2007.
    • (2007) IEEE Trans. Appl. Supercond , vol.17 , pp. 446-450
    • Inamdar, A.1    Rylov, S.2    Sahu, A.3    Sarwana, S.4    Gupta, D.5
  • 9
    • 0031168065 scopus 로고    scopus 로고
    • Octopux: An advanced automated setup for testing superconductor circuits
    • June
    • D. Y. Zinoviev and Y. A. Polyakov, "Octopux: An advanced automated setup for testing superconductor circuits," IEEE Trans. Appl. Superconduct., vol. 7, pp. 3240-3243, June 1997.
    • (1997) IEEE Trans. Appl. Superconduct , vol.7 , pp. 3240-3243
    • Zinoviev, D.Y.1    Polyakov, Y.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.