Microstructure and strength of the microjoined electrode for the lamp of the LCD backlight unit

Korean Journal of Materials Research

Volumn 19, Issue 1, 2009, Pages 7-12

  Kim, Gwangsoo ^a   Kim, Sangduck ^a  

^a Soonchunhyang University   (South Korea)

Author keywords

CCFL electrode; Microstructure; Microwelded electrode; TFT LCD

Indexed keywords

BACKLIGHT UNITS; CCFL ELECTRODE; ELECTRICAL RESISTANCES; FLAT DISPLAYS; GRAIN COARSENING; HEAT-AFFECTED ZONES; LCD BACKLIGHT UNIT; LEAD WIRE; MICRO TENSILE TESTS; MICROHARDNESS MEASUREMENT; MICROSTRUCTURE EXAMINATION; MICROWELDED ELECTRODE; POOR WELDS; RESISTANCE MEASUREMENT; TECHNICAL DATA; TFT LCD PANELS; TFT-LCD; TFT-LCDS;

HEAT AFFECTED ZONE; LIQUID CRYSTAL DISPLAYS; MICROHARDNESS; MICROSTRUCTURE; WELDING;

WELDING ELECTRODES;

EID: 68649103531     PISSN: 12250562     EISSN: None     Source Type: Journal    
DOI: 10.3740/MRSK.2009.19.1.007     Document Type: Article

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