Divergence analysis of atomic ionization processes and isoelectronic series

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 80, Issue 1, 2009, Pages

  Lopez Rosa S ^a   Antolin J ^a,b   Angulo, J C ^a   Esquivel, R O ^a,c  

^a UNIVERSITY OF GRANADA   (Spain)

^b UNIVERSITY OF ZARAGOZA   (Spain)

^c UNIVERSIDAD AUTÓNOMA METROPOLITANA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC IONIZATION; ATOMIC SYSTEM; CHARGED IONS; ELECTRON DENSITIES; EXTREMAL; INFORMATION CONCERNING; IONIZATION PROCESS; ISO-ELECTRONIC SERIES; JENSEN-SHANNON DIVERGENCE; MOMENTUM SPACES; NEUTRAL ATOMS; PERIODICITY PROPERTY; QUANTUM SIMILARITY;

ATOMS; IONIZATION OF LIQUIDS;

IONIZATION POTENTIAL;

EID: 68549118942     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.80.012505     Document Type: Article

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