Optical characterization of rf-Magnetron sputtered nanostructured SnO 2 thin films

Chinese Physics Letters

Volumn 26, Issue 7, 2009, Pages

  Khan, Abdul Faheem ^a   Mehmood, Mazhar ^a   Rana, A M ^b   Bhatti, M T ^b   Mahmood, A ^c  

^a PAKISTAN INSTITUTE OF ENGINEERING AND APPLIED SCIENCES   (Pakistan)

^b BAHAUDDIN ZAKARIYA UNIVERSITY   (Pakistan)

^c NILOP   (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ENERGY GAP; MAGNETRON SPUTTERING; OPTICAL CONDUCTIVITY; OXIDE FILMS; PARTICLE SIZE; REFRACTIVE INDEX; THIN FILMS; X RAY DIFFRACTION;

ANNEALED FILMS; AVERAGE PARTICLE SIZE; MATRIX; NANO-STRUCTURED; OPTICAL CHARACTERIZATION; R.F. MAGNETRON SPUTTERING; RF MAGNETRONS; RF-MAGNETRON SPUTTERING; SNO 2; THIN-FILMS;

TIN OXIDES;

EID: 68449102034     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/26/7/077803     Document Type: Article

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