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Physical Chemistry Chemical Physics

Volumn 11, Issue 31, 2009, Pages 6689-6699

ESR imaging in solid phase down to sub-micron resolution: Methodology and applications

(5) Blank, Aharon a Suhovoy, Ekaterina a Halevy, Revital a Shtirberg, Lazar a Harneit, Wolfgang b

a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY (Israel)

b FREIE UNIVERSITÄT BERLIN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 68349119058 PISSN: 14639076 EISSN: None Source Type: Journal
DOI: 10.1039/b905943a Document Type: Article

Times cited : (40)

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