An automated IC chip marking inspection system for surface mounted devices on taping machines

Journal of Scientific and Industrial Research

Volumn 68, Issue 5, 2009, Pages 361-366

  Chen, Shih Hung ^a   Liao, Te Tan ^a  

^a FAR EAST UNIVERSITY   (Taiwan)

Author keywords

Learning vector quantization; On line inspection; Surface mounted device

Indexed keywords

AUTOMATED SYSTEMS; AUTOMATIC RECOGNITION; DIGITAL LOGIC; FILTERING SCHEMES; HIGH-THROUGHPUT; IC CHIPS; IDEAL SOLUTIONS; INSPECTION SYSTEM; LEARNING VECTOR QUANTIZATION; MULTI-RESOLUTIONS; NOISE FILTERING; NORMALIZED CROSS-CORRELATION; ON-LINE INSPECTION; PACKAGING APPLICATIONS; PROCESSING APPROACH; REALTIME INSPECTION; RECOGNITION RATES; SEARCH PROCESS; STANDARD DEVIATION; SURFACE MOUNTED DEVICE; SURFACE MOUNTED DEVICES; TARGET IMAGES; TEMPLATE-MATCHING;

CHIP SCALE PACKAGES; IMAGE PROCESSING; IMAGING SYSTEMS; INSPECTION; SPURIOUS SIGNAL NOISE;

VECTOR QUANTIZATION;

ALGORITHM; AUTOMATION; DESIGN; INTERNET; LEARNING; MACHINERY; MARKING METHOD; REAL TIME;

EID: 68349101192     PISSN: 00224456     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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