Fractal analysis of Xylella fastidiosa biofilm formation

Journal of Applied Physics

Volumn 106, Issue 2, 2009, Pages

  Moreau, A L D ^a   Lorite, G S ^a   Rodrigues, C M ^b   Souza, A A ^b   Cotta, M A ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b INSTITUTO AGRONÔMICO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE; BIOFILM FORMATION; BIOFILM GROWTH; BIOFILM MATRIX; CORRELATION LENGTHS; DIFFUSION LIMITED AGGREGATION; EDEN MODEL; FRACTAL ANALYSIS; FRACTAL CHARACTERISTICS; GROWTH PROCESS; MATURATION STAGE; MORPHOLOGICAL VARIATION; NUTRIENT DIFFUSION; OPTICAL IMAGE; STRUCTURAL PATTERN; XYLELLA FASTIDIOSA;

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; BIOFILMS; FRACTAL DIMENSION; GEOMETRICAL OPTICS; GROWTH (MATERIALS); OPTICAL MICROSCOPY; SURFACE DIFFUSION;

BIOFILTERS;

EID: 68249146163     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3173172     Document Type: Article

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