Development of a sequence-characterized amplified region marker for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kühn

Letters in Applied Microbiology

Volumn 49, Issue 2, 2009, Pages 235-240

  Liu, J H ^a   Gao, L ^a   Liu, T G ^a   Chen, W Q ^a  

^a INSTITUTE OF PLANT PROTECTION   (China)

Author keywords

Amplified fragment length polymorphism; Dwarf bunt of wheat; PCR; Sequence characterized amplified region; Tilletia controversa K hn

Indexed keywords

ASSAYS; DNA; FUNGI; GENES; NUCLEIC ACIDS; POLYMORPHISM;

AMPLIFIED FRAGMENT LENGTH POLYMORPHISM; AMPLIFIED FRAGMENT LENGTH POLYMORPHISMS; DESTRUCTIVE DISEASE; DETECTION LIMITS; DNA FRAGMENT; DNA POLYMORPHISM; DWARF BUNT OF WHEAT; HIGH-THROUGHPUT ASSAYS; MOLECULAR MARKER; PATHOGENIC FUNGI; PCR; PCR DETECTION; PCR REACTIONS; PRIMER COMBINATIONS; RAPID IDENTIFICATION; SCAR MARKERS; SEQUENCE-CHARACTERIZED AMPLIFIED REGION; SPECIFIC PRIMERS;

DIAGNOSIS;

DNA FRAGMENT;

BIOASSAY; DETECTION METHOD; FUNGAL DISEASE; FUNGUS; GENETIC MARKER; PATHOGEN; POLYMERASE CHAIN REACTION; WHEAT;

AMPLIFIED FRAGMENT LENGTH POLYMORPHISM; ARTICLE; BASIDIOMYCETES; CONTROLLED STUDY; DNA POLYMORPHISM; DWARF BUNT; FUNGUS IDENTIFICATION; FUNGUS ISOLATION; MOLECULAR CLONING; NONHUMAN; PLANT DISEASE; POLYMERASE CHAIN REACTION; SENSITIVITY AND SPECIFICITY; SEQUENCE CHARACTERIZED AMPLIFIED REGION; TILLETIA CONTROVERSA; WHEAT;

FUNGI; TILLETIA CONTROVERSA; TRITICUM AESTIVUM;

EID: 68249141228     PISSN: 02668254     EISSN: 1472765X     Source Type: Journal    
DOI: 10.1111/j.1472-765X.2009.02645.x     Document Type: Article

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