Determination of the thickness and optical constants of amorphous Ge-Se-Bi thin films

Philosophical Magazine

Volumn 89, Issue 12, 2009, Pages 1005-1016

  Dahshan, A ^a   Aly, K A ^b  

^a Port Said University   (Egypt)

^b Al Azhar University   (Egypt)

Author keywords

Amorphous; Optical transmission; Thin films

Indexed keywords

AMORPHOUS; BI THIN FILMS; COMPLEX INDEX OF REFRACTION; EXTINCTION COEFFICIENTS; FUNDAMENTAL ABSORPTION EDGE; IMAGINARY PARTS; INTERFERENCE FRINGE; NORMAL INCIDENCE; OPTICAL ABSORPTION MEASUREMENT; OPTICAL TRANSMISSION; SPECTRAL REGION; TRANSMISSION SPECTRUMS;

ABSORPTION; AMORPHOUS FILMS; BISMUTH; GERMANIUM; LIGHT REFRACTION; LIGHT TRANSMISSION; OPTICAL CONSTANTS; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SELENIUM COMPOUNDS; THERMAL EVAPORATION; THIN FILMS;

OPTICAL FILMS;

EID: 68149181522     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430902835644     Document Type: Article

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